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Chiplytics PSA System

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Comprehensive Electrical Inspection for Critical Systems

Chiplytics develops cutting-edge inspection technology to quantify the authenticity and integrity of microelectronics. Power Spectrum Analysis (PSA) is used to evaluate homogeneity and identify outliers. Data acquisition is performed within seconds with minimal setup, enabling extensive coverage and high throughput.

How it works

1

Low voltage stimulus captures a unique power response

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2

Response converted into a frequency-domain signature

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3

Signatures compared using principal component analysis to detect anomalies

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Analogy: listen for subtle variations in pitch between bells

A hand-held module for running Power Spectrum Analysis (PSA)

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QUANTIFIABLE ASSURANCE

Power Spectrum Analysis (PSA) is used to perform a non-invasive modal analysis of an electrical part. Signatures reveal subtle, quantifiable differences between parts such as performance specifications, manufacturers, even down to date codes. â€‹

REPEATABLE PLATFORM

The Chiplytics PSA System integrates test and measurement capabilities into a small, repeatable form factor with minimal signal interference. Data processing and device calibration keep signatures consistent over time. 

SIMPLE INTERFACE

Interface components through the 40-pin zero insertion force (ZIF) socket or quickturn adapters provided by Chiplytics with fast turnaround for a wide range of package types. Simply upload the datasheet or provide the required pinout. 

CROSS-PLATFORM APP

Operate the Chiplytics PSA System over USB on Windows or Mac and view inspection results in realtime. Parameter sets can be configured to automate data acquisition and storage locally or over a secure cloud database. 

Specifications:

Example Use Cases

  1. Collect power signatures to evaluate homogeneity among a batch of components
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  2. Compare signatures against a golden sample or run more extensive testing (e.g. destructive) on a subset to verify authenticity of the entire batch
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  3. Capture power signature profiles of aged reference components to predict the health and lifetime remaining of other samples
     

  4. Quantify differences between parts before and after failure analysis, radiation hardening, or reverse engineering testing​

Quickturn Sockets for Any Semiconductor

Specify the part number and Chiplytics will produce a compatible socket to interface with the PSA system. 

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High-Volume Quality Assurance

The Chiplytics Microelectronics Inspection Platform (MIP) automates PSA testing for high volumes and varieties of components.

Demo
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Request a Quote

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